Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry (Q90454798)
scientific article published on 01 July 1963
Language:
(P31) (Q13442814)
(P304) 363-377
(P433) 4
(P478) 67A
(P577) Monday, July 1, 1963
(P921) (Q1137203)
(P1433) (Q28807466)
(P1476) "Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry" (language: en)
(P2093) Frank L McCrackin
Elio Passaglia
Robert R Stromberg
Harold L Steinberg
(P2860) (Q74750538)
other details
description scientific article published on 01 July 1963

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