Oxide thickness dependence of energy shifts in the Si 2p levels for the SiO2/Si structure, and its elimination by a palladium overlayer
(Q77027317)
scholarly article
scholarly article
Language:
Current Data About
Oxide thickness dependence of energy shifts in the Si 2p levels for the SiO2/Si structure, and its elimination by a palladium overlayer
| (P31) |
(Q13442814)
|
||||||||||||
| (P304) |
933-935
|
||||||||||||
| (P478) |
73
|
||||||||||||
| (P577) |
+1998-00-00T00:00:00Z
|
||||||||||||
| (P1433) |
(Q621615)
|
||||||||||||
| (P1476) |
"Oxide thickness dependence of energy shifts in the Si 2p levels for the SiO2/Si structure, and its elimination by a palladium overlayer" (language: en)
|
||||||||||||
| (P2860) |
(Q50113177)
(Q62675585)
|
other details