Atomic force microscope–force mapping and profiling on a sub 100‐Å scale (Q63407137)
Language:
(P31) (Q13442814)
(P50) (Q62140170)
(P304) 4723-4729
(P433) 10
(P478) 61
(P577) Friday, May 15, 1987
(P921) (Q196538)
(P1433) (Q1987941)
(P1476) "Atomic force microscope–force mapping and profiling on a sub 100‐Å scale" (language: en)
(P2093) Y. Martin
C. C. Williams
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