Energy distribution of surface states in the Si band-gap for MOS diodes obtained from XPS measurements under biases (Q62675592)
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Current Data About Energy distribution of surface states in the Si band-gap for MOS diodes obtained from XPS measurements under biases
(P31) (Q13442814)

(P304) 124-132

(P433) 1-2

(P478) 326

(P577) +1995-03-00T00:00:00Z

(P1433) (Q14421668)

(P1476) "Energy distribution of surface states in the Si band-gap for MOS diodes obtained from XPS measurements under biases" (language: en)

(P2093) H. Kobayashi
(P1545) 1

Y. Yamashita
(P1545) 2

T. Mori
(P1545) 3

Y. Nakato
(P1545) 4

K.H. Park
(P1545) 5

Y. Nishioka
(P1545) 6

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External Links
(P356) 10.1016/0039-6028(94)00769-1