High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling (Q62113392)
scientific article published on 15 June 1998
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Current Data About High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling
(P31) (Q13442814)

(P304) 3115-3117

(P407) (Q1860)

(P433) 24

(P478) 72

(P577) Monday, June 15, 1998

(P1433) (Q621615)

(P1476) "High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling" (language: en)

(P2093) J. A. Veerman
(P1545) 1

A. M. Otter
(P1545) 2

L. Kuipers
(P1545) 3

N. F. van Hulst
(P1545) 4

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description scientific article published on 15 June 1998

External Links
(P356) 10.1063/1.121564