Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy
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Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy
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1502-1506
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3
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3
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+1985-05-00T00:00:00Z
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(Q1074953)
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"Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy" (language: en)
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(P2093) |
K. Takayanagi
Y. Tanishiro
M. Takahashi
S. Takahashi
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