Atomic force microscopy: General aspects and application to insulators (Q58642792)
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Current Data About Atomic force microscopy: General aspects and application to insulators
(P31) (Q13442814)

(P50) (Q42842689)
(P248)

(P304) 275-278

(P407) (Q1860)

(P433) 2

(P478) 6

(P577) +1988-03-00T00:00:00Z

(P1433) (Q13739484)

(P1476) "Atomic force microscopy: General aspects and application to insulators" (language: en)

(P2093) H. Heinzelmann
(P1545) 1

E. Meyer
(P1545) 2

P. Grütter
(P1545) 3

H.‐R. Hidber
(P1545) 4

L. Rosenthaler
(P1545) 5

H.‐J. Güntherodt
(P1545) 6

other details

External Links
(P356) 10.1116/1.575424