An experimental comparison of measurement techniques to extract Si-SiO2 interface trap density (Q58194383)
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Current Data About An experimental comparison of measurement techniques to extract Si-SiO2 interface trap density
(P31) (Q13442814)

(P304) 345-355

(P433) 3

(P478) 35

(P577) +1992-03-00T00:00:00Z

(P1433) (Q16459978)

(P1476) "An experimental comparison of measurement techniques to extract Si-SiO2 interface trap density" (language: en)

(P2093) Steven C. Witczak
(P1545) 1

John S. Suehle
(P1545) 2

Michael Gaitan
(P1545) 3

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