TEM study of a silicate-carbonate-microbe interface prepared by focused ion beam milling
(Q57225672)
scholarly article
scholarly article
Language:
Current Data About
TEM study of a silicate-carbonate-microbe interface prepared by focused ion beam milling
(P31) |
(Q13442814)
|
||||||||||||
(P50) |
(Q42545927)
(Q56928859)
(Q120994072)
|
||||||||||||
(P304) |
1413-1422
|
||||||||||||
(P433) |
6
|
||||||||||||
(P478) |
69
|
||||||||||||
(P577) |
+2005-03-00T00:00:00Z
|
||||||||||||
(P1433) |
(Q5533966)
|
||||||||||||
(P1476) |
"TEM study of a silicate-carbonate-microbe interface prepared by focused ion beam milling" (language: en)
|
||||||||||||
(P2093) |
Christian Vanni
Philippe Gillet
|
||||||||||||
(P2860) |
(Q44099719)
|
other details
description | scholarly article |
External Links
(P356) |
10.1016/J.GCA.2004.09.008
|
(P819) |
2005GeCoA..69.1413B
|