Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry (Q52889163)
scientific article published on February 13, 2012
Language:
(P31) (Q13442814)
(P304) 4525-4536
(P407) (Q1860)
(P433) 4
(P478) 20
(P577) Wednesday, February 1, 2012
Monday, February 13, 2012
(P953) https://doi.org/10.1364/oe.20.004525
https://www.osapublishing.org/viewmedia.cfm?URI=oe-20-4-4525&seq=0
(P1433) (Q3354459)
(P1476) "Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry" (language: en)
(P2093) Frank Siewert
Jana Buchheim
Sébastien Boutet
Jacek Krzywinski
Riccardo Signorato
Garth J. Williams
Paul A. Montanez
(P2860) (Q120438189)
(Q60178884)
(Q85008717)
(Q33248289)
(Q46461019)
other details
description scientific article published on February 13, 2012

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