The use of low temperature X-ray diffraction to evaluate freezing methods used in freeze-fracture electron microscopy
(Q36604384)
scientific article published on January 1, 1978
scientific article published on January 1, 1978
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The use of low temperature X-ray diffraction to evaluate freezing methods used in freeze-fracture electron microscopy
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description | scientific article published on January 1, 1978 |
External Links
(P356) |
10.1111/J.1365-2818.1978.TB01158.X
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(P698) |
641982
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