The use of low temperature X-ray diffraction to evaluate freezing methods used in freeze-fracture electron microscopy (Q36604384)
scientific article published on January 1, 1978
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(P31) (Q13442814)
(P304) 103-113
(P407) (Q1860)
(P433) 1
(P478) 112
(P577) Sunday, January 1, 1978
(P921) (Q12101244)
(P953) https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1111%2Fj.1365-2818.1978.tb01158.x
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1978.tb01158.x/fullpdf
(P1433) (Q6295564)
(P1476) "The use of low temperature X-ray diffraction to evaluate freezing methods used in freeze-fracture electron microscopy" (language: en)
(P2093) T. Gulik-Krzywicki
M. J. Costello
(P2860) (Q44882252)
(Q40031351)
(Q71722592)
(Q69784634)
(Q72244556)
(Q69584335)
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description scientific article published on January 1, 1978

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