single-event upset
(Q1476733)
change of state caused by one single ionizing particle (ion, electron, photon...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor
change of state caused by one single ionizing particle (ion, electron, photon...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor
Language:
Current Data About
single-event upset
other details
| aliases |
single event upset SEU single-event error SEE SEUs SEEs |
| description | change of state caused by one single ionizing particle (ion, electron, photon...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor |
External Links
| (P646) |
/m/06r59m
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| (P6366) |
2780073065
|
| (P8834) |
singleEventUpset
|
| (P10283) |
C2780073065
|
| (P10565) |
301997
|