Focused ion beam micromachining for transmission electron microscopy specimen preparation of semiconductor laser diodes
(Q129864057)
scholarly article published in March 1992
scholarly article published in March 1992
Language:
Current Data About
Focused ion beam micromachining for transmission electron microscopy specimen preparation of semiconductor laser diodes
| (P31) |
(Q13442814)
|
||||||||||||||||
| (P304) |
575-579
|
||||||||||||||||
| (P407) |
(Q1860)
|
||||||||||||||||
| (P433) |
2
|
||||||||||||||||
| (P478) |
10
|
||||||||||||||||
| (P577) |
Sunday, March 1, 1992
|
||||||||||||||||
| (P973) |
https://pubs.aip.org/jvb/article/10/2/575/418815/Focused-ion-beam-micromachining-for-transmission
|
||||||||||||||||
| (P1433) |
(Q13739491)
|
||||||||||||||||
| (P1476) |
"Focused ion beam micromachining for transmission electron microscopy specimen preparation of semiconductor laser diodes" (language: en)
|
||||||||||||||||
| (P2093) |
J. Szot
R. Hornsey
T. Ohnishi
S. Minagawa
|
other details